ES1D Diode | Datasheet, Equivalent, SMD | Vishay, Fairchild MDD
- Brands: MDD
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- Price: inquiry
- In Stock: 14,533
- Voltage-DCReverse(Vr)(Max): 200 V
- Current-AverageRectified(Io): 1A
- Voltage-Forward(Vf)(Max)@If: 1 V @ 1 A
- Package: DO-214AC, SMA

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Es1d Diode Equivalent
es1d diode Picture
In the design of electronic circuits, the choice of diode will directly affect the performance of the entire circuit.ES1D is a common fast recovery diode with SMA (DO-214AC), which is widely used in switching power supplies, LED drivers and inverters, and other electronic power equipment.
Explanation of important parameters:
Reverse maximum withstand voltage value is 200V;
Forward conduction current is 1A.
Maximum current withstand is 30A (non-continuous current).
Reverse recovery time is 35ns.
Forward voltage drop is 1.3V (typical at 1A continuous current).
Equivalent model comparison:
Name | VRRM | IF(AV) | trr | Package |
---|---|---|---|---|
US1DW | 200V | 1A | 50ns | SOD-123FL |
MURA120T3G | 200V | 1A | 25ns | SMA(DO-214AC) |
ES2DB | 200V | 2A | 30ns | DO-214AA(SMB) |
US2DB | 200V | 2A | 50ns | SMB |
STTH2R02UY | 200V | 2A | 30ns | DO-214AA |
US1DW Picture
MURA120T3G Picture
ES2DB Picture
US2DB Picture
STTH2R02UY Picture
Selection recommendations: under the conditions of the original device, important parameters such as package (if you are willing to re-draw the PCB can not take this into account), VRRM, IF (AV)) must be greater than or equal to the original device, the other parameters can be more appropriate selection of the circuit, in general, es1d has a lot of options that can be replaced. If you consider the cost of the case, we can choose a domestic alternative.
Test verification: After the replacement of several verification to ensure that the replacement of the product can still be long-term normal use; the first is the switching waveform test (using an oscilloscope to observe the switching time and the peak value of the voltage pulse); the second is to be considered in the full-load case of warming (to avoid the temperature exceeds the junction temperature leading to the circuit to be burned out); the third is the long-term aging test (continuous use of the full-load to verify the stability).